Materials Analysis and Applications (MATS 702)
Offered By:
Engineering and Materials Science Faculty
Description
Optical microscopy and image analysis, Scanning and Transmission electron microscopy (SEM), (TEM), Electron Back Scatter Diffraction (EBSD) and material texture analysis, Auger Electron Spectroscopy and Element Dispersive X-ray Scattering (EDX), ESCA, spark analysis, SIMS